Credit hours
In-class work per week |
Practice per week |
Credits |
Duration |
Total |
1 |
3 |
4 |
15 weeks |
60 hours |
Instructor
Jorge Alberto Marques Rezende
Nelson Sidnei Massola Júnior
Objective
Enable those interested in scanning electron microscopy (SEM) techniques: manipulation of the scanning
electron microscope and peripheral instruments, sample preparation, interpretation and image
recording.
Content
1. General principles of electronic optics 2. Concept of resolution 3. Constitution and operation of the
scanning electron microscope 4. Sample preparation techniques 5. Handling of the scanning electron
microscope, metallizer and critical point drying equipment. 6. Imaging, interpretation and registration 7.
Examples of scanning electron microscopy applications.
Bibliography
Bozzola, J.J. & Russell, L.D. Electron microscopy. 2nd. Ed. Boston, Jones & Bartlett. 1999 Goldstein, J.I.
et al. Scanning electron microscopy and X-ray microanalysis. 2nd Ed. N.York, Plenum. 1992. Kessel,
R.G. & Shih, C.Y. Scanning electron microscopy in Biology. Berlin, Springer Verlag. 1974. Kitajima, E.W.
& Leite, B. Introdução à microscopia eletrônica de varredura. Piracicaba, NAP/MEPA. 42p. 1999.